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Abstract
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Article Information:
Time Truncated Testing Strategy using Multiple Testers: Lognormal Distributed Lifetime
Itrat Batool Naqvi and 2Muhammad Aslam
Corresponding Author: Muhammad Aslam
Submitted: January 16, 2014
Accepted: February 15, 2014
Published: June 10, 2014 |
Abstract:
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In this study, group acceptance sampling plan proposed by Aslam et al. (2011) is reconsidered when the lifetime variant of the test item follows lognormal distribution. The optimal plan parameters are obtained by considering various pre-specified parameters. The plan parameters are obtained using the non-linear optimization solution using two points approach. The advantage of the proposed plan is discussed over the existing plan using the single point approach and the proposed plan is more efficient than the existing plan.
Key words: Group acceptance sampling plan, lognormal distribution, producer’s risk and consumer’s risk, testers, , ,
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Abstract
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Cite this Reference:
Itrat Batool Naqvi and 2Muhammad Aslam, . Time Truncated Testing Strategy using Multiple Testers: Lognormal Distributed Lifetime. Research Journal of Applied Sciences, Engineering and Technology, (22): 4745-4748.
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ISSN (Online): 2040-7467
ISSN (Print): 2040-7459 |
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