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Article Information:
Multiple Optimal Solutions and Sag Occurrence Index Based Placement of Voltage Sag Monitors
M.A. Ali, Manoj Fozdar, K. R. Niazi and A. R. Phadke
Corresponding Author: M.A. Ali
Submitted: June 28, 2013
Accepted: July 17, 2013
Published: May 10, 2014 |
Abstract:
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This study presents optimal placement of voltage sag monitors based on new Sag Occurrence Index (SOI) which ensures observability even in case of monitor failure or line outages. Multiple solutions for optimal placement of voltage sag monitors for voltage sag detection have been obtained by genetic algorithm approach such that observability of the whole system is guaranteed. A new Sag Occurrence Index (SOI) is proposed to obtain the severity of voltage sag at all the buses in the system. To obtain the best monitor arrangement in the system, the sum of SOI for each optimal combination is determined. IEEE 24-bus Reliability Test System (RTS) and IEEE 57-bus system were used to demonstrate the effectiveness of the proposed method. The details of implementation and simulation results are also presented.
Key words: Multiple optimal solutions, power quality, Sag Occurrence Index (SOI), voltage sag, voltage sag monitoring, ,
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Cite this Reference:
M.A. Ali, Manoj Fozdar, K. R. Niazi and A. R. Phadke, . Multiple Optimal Solutions and Sag Occurrence Index Based Placement of Voltage Sag Monitors. Research Journal of Applied Sciences, Engineering and Technology, (18): 3716-3724.
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ISSN (Online): 2040-7467
ISSN (Print): 2040-7459 |
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