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2012 (Vol. 4, Issue: 12)
Article Information:

A Novel Approach for X-filling and Reordering Test Vectors for Power Reduction

C.R. Supreta Devi and K.A. Venkatraman and D. Muralidharan
Corresponding Author:  D. Muralidharan 

Key words:  Peak power, reordering, switching activity, TSP, X-filling, X-identification,
Vol. 4 , (12): 1801-1804
Submitted Accepted Published
February 02, 2012 March 06, 2012 June 15, 2012
Abstract:

Optimization of testing power is a significant task to be carried out in digital circuit design. During testing, the power dissipation will be high due to very high number of toggles between test vectors. Hence power minimization is significant during testing. X bits in the test vectors are identified and then X bits are replaced with their appropriate values. The filled vector set is next reordered. In this study, Kruskal based approach is proposed for reordering the vector to minimize the number of toggles and hence power consumption. It is experimented with ISCAS89 benchmark circuits, generated from MINTEST to validate our study.
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  Cite this Reference:
C.R. Supreta Devi and K.A. Venkatraman and D. Muralidharan, 2012. A Novel Approach for X-filling and Reordering Test Vectors for Power Reduction.  Research Journal of Applied Sciences, Engineering and Technology, 4(12): 1801-1804.
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ISSN (Online):  2040-7467
ISSN (Print):   2040-7459
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