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Abstract
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Article Information:
An Innovative Test Data Compression Method Using Scan Chain Compaction
S. Sowmiyaa and D. Muralidharan
Corresponding Author: D. Muralidharan
Submitted: February 02, 2012
Accepted: February 22, 2012
Published: June 15, 2012 |
Abstract:
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Test data compression method is a key issue for reducing test data volume and test application time.
Various techniques have been developed with great success on dealing with data compression. The previous
schemes of compression techniques have been developed to reduce test data volume but the application time
is not sufficiently reduced. Additional fault simulation and test generation are necessary to advice high fault
coverage. The proposed Odd-Even Scan Network (OESN) provides the high compression ratio and the fast
testing time. The compatible scan cell group is planned to implement and it will be integrated with the existing
scan chain compaction. The experimental results on ISCAS-89 show that the proposed approach achieves high
compression ratio.
Key words: ATE, fault coverage, graph coloring, scan chain, test vector, ,
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Abstract
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Cite this Reference:
S. Sowmiyaa and D. Muralidharan, . An Innovative Test Data Compression Method Using Scan Chain Compaction. Research Journal of Applied Sciences, Engineering and Technology, (12): 1790-1793.
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ISSN (Online): 2040-7467
ISSN (Print): 2040-7459 |
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