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2014 (Vol. 6, Issue: 2)
Article Information:

Continuous-wave Terahertz Imaging Applied to Detect Infestations Caused by Insects in Grain

Zuojun Tan, Jun Lu, Jun Luo and Jing Xie
Corresponding Author:  Jun Lu 

Key words:  Detection, infestation, insect, terahertz imaging, wheat grain, ,
Vol. 6 , (2): 271-274
Submitted Accepted Published
October 25, 2013 November 07, 2013 February 10, 2014
Abstract:

Detection infestations caused by insects in grain are important control measures for ensuring storage longevity, seed quality and food safety. The efficiency of the continuous wave terahertz imaging method to detect infestations caused by insects in wheat kernels was determined in this study. A continuous wave terahertz experimental setup was designed for recording of THz images corresponding to different infestations caused by different life stages of insects. The experimental results indicate that the absorbance is generally highest for un-infested wheat kernels and decreased at later growth stages from THz pseudo-color images. Our study intended to demonstrate how the method of continuous wave Terahertz imaging could be applied to detect Infestations Caused by Insects in Grain.
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  Cite this Reference:
Zuojun Tan, Jun Lu, Jun Luo and Jing Xie, 2014. Continuous-wave Terahertz Imaging Applied to Detect Infestations Caused by Insects in Grain.  Advance Journal of Food Science and Technology, 6(2): 271-274.
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ISSN (Online):  2042-4876
ISSN (Print):   2042-4868
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